In the world of scanning tunneling microscopy (STM) and atomic force microscopy (AFM), carbon nanotubes are considered the tips of choice. This is due to their tiny diameters, high aspect-ratio, and strength. In the last five years, processes been developed to reliably attach carbon nanotubes to tungsten tips for STM/AFM use. Improvements to nanoscale visualization and manipulation tools merit special attention in the world of nanotech advances, because it is improvements in the tools that enable qualitatively new steps forward that were impossible previously.